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• 1. [Article] Computation of dark frames in digital imagers

  Dark current is caused by electrons that are thermally exited into the conduction band. These electrons are collected by the well of the CCD and add a false signal to the chip. We will present an algorithm ...

  Citation × Citation Citation Abstract Copy Title: Computation of dark frames in digital imagers Author: Widenhorn, Ralf, Rest, Armin, Blouke, Morley M., Berry, Richard L., Bodegom, Erik Year: 2007 Dark current is caused by electrons that are thermally exited into the conduction band. These electrons are collected by the well of the CCD and add a false signal to the chip. We will present an algorithm that automatically corrects for dark current. It uses a calibration protocol to characterize the image sensor for different temperatures. For a given exposure time, the dark current of every pixel is characteristic of a specific temperature. The dark current of every pixel can therefore be used as an indicator of the temperature. Hot pixels have the highest signal-to-noise ratio and are the best temperature sensors. We use the dark current of a several hundred hot pixels to sense the chip temperature and predict the dark current of all pixels on the chip. Dark current computation is not a new concept, but our approach is unique. Some advantages of our method include applicability for poorly temperature-controlled camera systems and the possibility of ex post facto dark current correction. Title: Computation of dark frames in digital imagers Author: Widenhorn, Ralf, Rest, Armin, Blouke, Morley M., Berry, Richard L., Bodegom, Erik Year: 2007 Dark current is caused by electrons that are thermally exited into the conduction band. These electrons are collected by the well of the CCD and add a false signal to the chip. We will present an algorithm that automatically corrects for dark current. It uses a calibration protocol to characterize the image sensor for different temperatures. For a given exposure time, the dark current of every pixel is characteristic of a specific temperature. The dark current of every pixel can therefore be used as an indicator of the temperature. Hot pixels have the highest signal-to-noise ratio and are the best temperature sensors. We use the dark current of a several hundred hot pixels to sense the chip temperature and predict the dark current of all pixels on the chip. Dark current computation is not a new concept, but our approach is unique. Some advantages of our method include applicability for poorly temperature-controlled camera systems and the possibility of ex post facto dark current correction. Close

• 2. [Article] Residual images in charged-coupled device detectors

  We present results of a systematic study of persistent, or residual, images that occur in charged-coupled device (CCD) detectors. A phenomenological model for these residual images, also known as "ghosting," ...

  Citation × Citation Citation Abstract Copy Title: Residual images in charged-coupled device detectors Author: Rest, Armin, Mündermann, Lars, Widenhorn, Ralf, Bodegom, Erik, McGlinn, T. C. Year: 2002 We present results of a systematic study of persistent, or residual, images that occur in charged-coupled device (CCD) detectors. A phenomenological model for these residual images, also known as "ghosting," is introduced. This model relates the excess dark current in a CCD after exposure to the number of filled impurity sites which is tested for various temperatures and exposure times. We experimentally derive values for the cross section, density, and characteristic energy of the impurity sites responsible for the residual images. Title: Residual images in charged-coupled device detectors Author: Rest, Armin, Mündermann, Lars, Widenhorn, Ralf, Bodegom, Erik, McGlinn, T. C. Year: 2002 We present results of a systematic study of persistent, or residual, images that occur in charged-coupled device (CCD) detectors. A phenomenological model for these residual images, also known as "ghosting," is introduced. This model relates the excess dark current in a CCD after exposure to the number of filled impurity sites which is tested for various temperatures and exposure times. We experimentally derive values for the cross section, density, and characteristic energy of the impurity sites responsible for the residual images. Close