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• 1. [Article] Meyer-Neldel rule for dark current in charge-coupled devices

  We present the results of a systematic study of the dark current in each pixel of a charged-coupled device chip. It was found that the Arrhenius plot, at temperatures between 222 and 291 K, deviated from ...

  Citation × Citation Citation Abstract Copy Title: Meyer-Neldel rule for dark current in charge-coupled devices Author: Widenhorn, Ralf, Mündermann, Lars, Rest, Armin, Bodegom, Erik Year: 2001 We present the results of a systematic study of the dark current in each pixel of a charged-coupled device chip. It was found that the Arrhenius plot, at temperatures between 222 and 291 K, deviated from a linear behavior in the form of continuous bending. However, as a first approximation, the dark current, D, can be expressed as: D=Dₒ exp(−ΔE/kT),where ΔE is the activation energy, k is Boltzmann’s constant, and T the absolute temperature. It was found that ΔE and the exponential prefactor Dₒ follow the Meyer–Neldel rule (MNR) for all of the more than 222,000 investigated pixels. The isokinetic temperature, Tₒ, for the process was found as 294 K. However, measurements at 313 K did not show the predicted inversion in the dark current. It was found that the dark current for different pixels merged at temperatures higher than Tₒ. A model is presented which explains the nonlinearity and the merging of the dark current for different pixels with increasing temperature. Possible implications of this finding regarding the MNR are discussed. Title: Meyer-Neldel rule for dark current in charge-coupled devices Author: Widenhorn, Ralf, Mündermann, Lars, Rest, Armin, Bodegom, Erik Year: 2001 We present the results of a systematic study of the dark current in each pixel of a charged-coupled device chip. It was found that the Arrhenius plot, at temperatures between 222 and 291 K, deviated from a linear behavior in the form of continuous bending. However, as a first approximation, the dark current, D, can be expressed as: D=Dₒ exp(−ΔE/kT),where ΔE is the activation energy, k is Boltzmann’s constant, and T the absolute temperature. It was found that ΔE and the exponential prefactor Dₒ follow the Meyer–Neldel rule (MNR) for all of the more than 222,000 investigated pixels. The isokinetic temperature, Tₒ, for the process was found as 294 K. However, measurements at 313 K did not show the predicted inversion in the dark current. It was found that the dark current for different pixels merged at temperatures higher than Tₒ. A model is presented which explains the nonlinearity and the merging of the dark current for different pixels with increasing temperature. Possible implications of this finding regarding the MNR are discussed. Close

• 2. [Article] Residual images in charged-coupled device detectors

  We present results of a systematic study of persistent, or residual, images that occur in charged-coupled device (CCD) detectors. A phenomenological model for these residual images, also known as "ghosting," ...

  Citation × Citation Citation Abstract Copy Title: Residual images in charged-coupled device detectors Author: Rest, Armin, Mündermann, Lars, Widenhorn, Ralf, Bodegom, Erik, McGlinn, T. C. Year: 2002 We present results of a systematic study of persistent, or residual, images that occur in charged-coupled device (CCD) detectors. A phenomenological model for these residual images, also known as "ghosting," is introduced. This model relates the excess dark current in a CCD after exposure to the number of filled impurity sites which is tested for various temperatures and exposure times. We experimentally derive values for the cross section, density, and characteristic energy of the impurity sites responsible for the residual images. Title: Residual images in charged-coupled device detectors Author: Rest, Armin, Mündermann, Lars, Widenhorn, Ralf, Bodegom, Erik, McGlinn, T. C. Year: 2002 We present results of a systematic study of persistent, or residual, images that occur in charged-coupled device (CCD) detectors. A phenomenological model for these residual images, also known as "ghosting," is introduced. This model relates the excess dark current in a CCD after exposure to the number of filled impurity sites which is tested for various temperatures and exposure times. We experimentally derive values for the cross section, density, and characteristic energy of the impurity sites responsible for the residual images. Close