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• 1. [Article] Temperature dependence of dark current in a CCD

  We present data for dark current of a back-illuminated CCD over the temperature range of 222 to 291 K. Using an Arrhenius law, we found that the analysis of the data leads to the relation between the prefactor ...

  Citation × Citation Citation Abstract Copy Title: Temperature dependence of dark current in a CCD Author: Widenhorn, Ralf, Blouke, Morley M., Weber, Alexander, Rest, Armin, Bodegom, Erik Year: 2002 We present data for dark current of a back-illuminated CCD over the temperature range of 222 to 291 K. Using an Arrhenius law, we found that the analysis of the data leads to the relation between the prefactor and the apparent activation energy as described by the Meyer-Neldel rule. However, a more detailed analysis shows that the activation energy for the dark current changes in the temperature range investigated. This transition can be explained by the larger relative importance at high temperatures of the diffusion dark current and at low temperatures by the depletion dark current. The diffusion dark current, characterized by the band gap of silicon, is uniform for all pixels. At low temperatures, the depletion dark current, characterized by half the band gap, prevails, but it varies for different pixels. Dark current spikes are pronounced at low temperatures and can be explained by large concentrations of deep level impurities in those particular pixels. We show that fitting the data with the impurity concentration as the only variable can explain the dark current characteristics of all the pixels on the chip. Title: Temperature dependence of dark current in a CCD Author: Widenhorn, Ralf, Blouke, Morley M., Weber, Alexander, Rest, Armin, Bodegom, Erik Year: 2002 We present data for dark current of a back-illuminated CCD over the temperature range of 222 to 291 K. Using an Arrhenius law, we found that the analysis of the data leads to the relation between the prefactor and the apparent activation energy as described by the Meyer-Neldel rule. However, a more detailed analysis shows that the activation energy for the dark current changes in the temperature range investigated. This transition can be explained by the larger relative importance at high temperatures of the diffusion dark current and at low temperatures by the depletion dark current. The diffusion dark current, characterized by the band gap of silicon, is uniform for all pixels. At low temperatures, the depletion dark current, characterized by half the band gap, prevails, but it varies for different pixels. Dark current spikes are pronounced at low temperatures and can be explained by large concentrations of deep level impurities in those particular pixels. We show that fitting the data with the impurity concentration as the only variable can explain the dark current characteristics of all the pixels on the chip. Close

• 2. [Article] Computation of dark frames in digital imagers

  Dark current is caused by electrons that are thermally exited into the conduction band. These electrons are collected by the well of the CCD and add a false signal to the chip. We will present an algorithm ...

  Citation × Citation Citation Abstract Copy Title: Computation of dark frames in digital imagers Author: Widenhorn, Ralf, Rest, Armin, Blouke, Morley M., Berry, Richard L., Bodegom, Erik Year: 2007 Dark current is caused by electrons that are thermally exited into the conduction band. These electrons are collected by the well of the CCD and add a false signal to the chip. We will present an algorithm that automatically corrects for dark current. It uses a calibration protocol to characterize the image sensor for different temperatures. For a given exposure time, the dark current of every pixel is characteristic of a specific temperature. The dark current of every pixel can therefore be used as an indicator of the temperature. Hot pixels have the highest signal-to-noise ratio and are the best temperature sensors. We use the dark current of a several hundred hot pixels to sense the chip temperature and predict the dark current of all pixels on the chip. Dark current computation is not a new concept, but our approach is unique. Some advantages of our method include applicability for poorly temperature-controlled camera systems and the possibility of ex post facto dark current correction. Title: Computation of dark frames in digital imagers Author: Widenhorn, Ralf, Rest, Armin, Blouke, Morley M., Berry, Richard L., Bodegom, Erik Year: 2007 Dark current is caused by electrons that are thermally exited into the conduction band. These electrons are collected by the well of the CCD and add a false signal to the chip. We will present an algorithm that automatically corrects for dark current. It uses a calibration protocol to characterize the image sensor for different temperatures. For a given exposure time, the dark current of every pixel is characteristic of a specific temperature. The dark current of every pixel can therefore be used as an indicator of the temperature. Hot pixels have the highest signal-to-noise ratio and are the best temperature sensors. We use the dark current of a several hundred hot pixels to sense the chip temperature and predict the dark current of all pixels on the chip. Dark current computation is not a new concept, but our approach is unique. Some advantages of our method include applicability for poorly temperature-controlled camera systems and the possibility of ex post facto dark current correction. Close

• 3. [Article] Meyer-Neldel rule for dark current in charge-coupled devices

  We present the results of a systematic study of the dark current in each pixel of a charged-coupled device chip. It was found that the Arrhenius plot, at temperatures between 222 and 291 K, deviated from ...

  Citation × Citation Citation Abstract Copy Title: Meyer-Neldel rule for dark current in charge-coupled devices Author: Widenhorn, Ralf, Mündermann, Lars, Rest, Armin, Bodegom, Erik Year: 2001 We present the results of a systematic study of the dark current in each pixel of a charged-coupled device chip. It was found that the Arrhenius plot, at temperatures between 222 and 291 K, deviated from a linear behavior in the form of continuous bending. However, as a first approximation, the dark current, D, can be expressed as: D=Dₒ exp(−ΔE/kT),where ΔE is the activation energy, k is Boltzmann’s constant, and T the absolute temperature. It was found that ΔE and the exponential prefactor Dₒ follow the Meyer–Neldel rule (MNR) for all of the more than 222,000 investigated pixels. The isokinetic temperature, Tₒ, for the process was found as 294 K. However, measurements at 313 K did not show the predicted inversion in the dark current. It was found that the dark current for different pixels merged at temperatures higher than Tₒ. A model is presented which explains the nonlinearity and the merging of the dark current for different pixels with increasing temperature. Possible implications of this finding regarding the MNR are discussed. Title: Meyer-Neldel rule for dark current in charge-coupled devices Author: Widenhorn, Ralf, Mündermann, Lars, Rest, Armin, Bodegom, Erik Year: 2001 We present the results of a systematic study of the dark current in each pixel of a charged-coupled device chip. It was found that the Arrhenius plot, at temperatures between 222 and 291 K, deviated from a linear behavior in the form of continuous bending. However, as a first approximation, the dark current, D, can be expressed as: D=Dₒ exp(−ΔE/kT),where ΔE is the activation energy, k is Boltzmann’s constant, and T the absolute temperature. It was found that ΔE and the exponential prefactor Dₒ follow the Meyer–Neldel rule (MNR) for all of the more than 222,000 investigated pixels. The isokinetic temperature, Tₒ, for the process was found as 294 K. However, measurements at 313 K did not show the predicted inversion in the dark current. It was found that the dark current for different pixels merged at temperatures higher than Tₒ. A model is presented which explains the nonlinearity and the merging of the dark current for different pixels with increasing temperature. Possible implications of this finding regarding the MNR are discussed. Close

• 4. [Article] The Meyer-Neldel rule for diodes in forward bias

  We analyzed the temperature dependence of the forward current of a silicon diode. Instead of representing the data in the ordinarily used current versus voltage graph, the currents are plotted for different ...

  Citation × Citation Citation Abstract Copy Title: The Meyer-Neldel rule for diodes in forward bias Author: Widenhorn, Ralf, Fitzgibbons, Michael, Bodegom, Erik Year: 2004 We analyzed the temperature dependence of the forward current of a silicon diode. Instead of representing the data in the ordinarily used current versus voltage graph, the currents are plotted for different voltages as a function of the inverse temperature. The constant voltage curves can be fitted linearly and the extrapolations of the fits seem to merge to one common focal point. Hence, we demonstrate that a real diode follows the Meyer-Neldel rule (MNR). It is shown that the MNR is due to a shift of the current from ideal-diode to high-injection-diode behavior. We will argue that the merging of the different Arrhenius plots toward one focal point, and hence a MNR, can be the result of various mechanisms. The general requirements to observe a MNR are not very restrictive. It is therefore not surprising that the MNR has been observed in a multitude of systems. The origin that gives rise to the MNR can be manifold and allows for different models to explain its occurrence. Title: The Meyer-Neldel rule for diodes in forward bias Author: Widenhorn, Ralf, Fitzgibbons, Michael, Bodegom, Erik Year: 2004 We analyzed the temperature dependence of the forward current of a silicon diode. Instead of representing the data in the ordinarily used current versus voltage graph, the currents are plotted for different voltages as a function of the inverse temperature. The constant voltage curves can be fitted linearly and the extrapolations of the fits seem to merge to one common focal point. Hence, we demonstrate that a real diode follows the Meyer-Neldel rule (MNR). It is shown that the MNR is due to a shift of the current from ideal-diode to high-injection-diode behavior. We will argue that the merging of the different Arrhenius plots toward one focal point, and hence a MNR, can be the result of various mechanisms. The general requirements to observe a MNR are not very restrictive. It is therefore not surprising that the MNR has been observed in a multitude of systems. The origin that gives rise to the MNR can be manifold and allows for different models to explain its occurrence. Close

• 5. [Article] Dark current behavior in DSLR cameras

  Digital single-lens reflex (DSLR) cameras are examined and their dark current behavior is presented. We examine the influence of varying temperature, exposure time, and gain setting on dark current. Dark ...

  Citation × Citation Citation Abstract Copy Title: Dark current behavior in DSLR cameras Author: Dunlap, Justin Charles, Sostin, Oleg, Widenhorn, Ralf, Bodegom, Erik Year: 2009 Digital single-lens reflex (DSLR) cameras are examined and their dark current behavior is presented. We examine the influence of varying temperature, exposure time, and gain setting on dark current. Dark current behavior unique to sensors within such cameras is observed. In particular, heat is trapped within the camera body resulting in higher internal temperatures and an increase in dark current after successive images. We look at the possibility of correcting for the dark current, based on previous work done for scientific grade imagers, where hot pixels are used as indicators for the entire chip?s dark current behavior. Standard methods of dark current correction are compared to computed dark frames. Dark current is a concern for DSLR cameras as optimum conditions for limiting dark current, such as cooling the imager, are not easily obtained in the typical use of such imagers. Title: Dark current behavior in DSLR cameras Author: Dunlap, Justin Charles, Sostin, Oleg, Widenhorn, Ralf, Bodegom, Erik Year: 2009 Digital single-lens reflex (DSLR) cameras are examined and their dark current behavior is presented. We examine the influence of varying temperature, exposure time, and gain setting on dark current. Dark current behavior unique to sensors within such cameras is observed. In particular, heat is trapped within the camera body resulting in higher internal temperatures and an increase in dark current after successive images. We look at the possibility of correcting for the dark current, based on previous work done for scientific grade imagers, where hot pixels are used as indicators for the entire chip?s dark current behavior. Standard methods of dark current correction are compared to computed dark frames. Dark current is a concern for DSLR cameras as optimum conditions for limiting dark current, such as cooling the imager, are not easily obtained in the typical use of such imagers. Close

• 6. [Article] The Meyer-Neldel rule for a property determined by two transport mechanisms

  We propose that the Meyer-Neldel rule (MNR) arises naturally for a quantity where both an intrinsic process as well as a process involving impurities contribute. The strength of the latter depends solely ...

  Citation × Citation Citation Abstract Copy Title: The Meyer-Neldel rule for a property determined by two transport mechanisms Author: Widenhorn, Ralf, Rest, Armin, Bodegom, Erik Year: 2002 We propose that the Meyer-Neldel rule (MNR) arises naturally for a quantity where both an intrinsic process as well as a process involving impurities contribute. The strength of the latter depends solely on the density of the impurities. This leads to a spread in the apparent activation energy of the measured quantity and the observation of the MNR, even though the intrinsic processes have fixed activation energies. A consequence of the MNR is the occurrence of a temperature T[sub MN] where a measured parameter is independent of the activation energy. For the system studied, the MNR does not accurately predict the results at temperatures larger than T[sub MN]. Our model for the MNR is supported by experimental data and it also can explain the inverse MNR for low activation energies. Title: The Meyer-Neldel rule for a property determined by two transport mechanisms Author: Widenhorn, Ralf, Rest, Armin, Bodegom, Erik Year: 2002 We propose that the Meyer-Neldel rule (MNR) arises naturally for a quantity where both an intrinsic process as well as a process involving impurities contribute. The strength of the latter depends solely on the density of the impurities. This leads to a spread in the apparent activation energy of the measured quantity and the observation of the MNR, even though the intrinsic processes have fixed activation energies. A consequence of the MNR is the occurrence of a temperature T[sub MN] where a measured parameter is independent of the activation energy. For the system studied, the MNR does not accurately predict the results at temperatures larger than T[sub MN]. Our model for the MNR is supported by experimental data and it also can explain the inverse MNR for low activation energies. Close

• 7. [Article] Infrared response of charge-coupled devices

  With a band gap of silicon of 1.1eV, the largest wavelength that can excite electrons from the valence to the conduction band is roughly 1100nm. As a consequence, in, for instance, a charge-coupled device, ...

  Citation × Citation Citation Abstract Copy Title: Infrared response of charge-coupled devices Author: Loch, Matthias, Widenhorn, Ralf, Bodegom, Erik Year: 2005 With a band gap of silicon of 1.1eV, the largest wavelength that can excite electrons from the valence to the conduction band is roughly 1100nm. As a consequence, in, for instance, a charge-coupled device, the quantum efficiency (QE) for wavelengths larger than 1100nm is assumed to be zero. We found that there is a response at those longer wavelengths and that the response decreases with increasing wavelength. The QE increases with increasing chip temperature which suggests a thermally activated process. Impurities in the silicon provide the energy levels in the band gap, from which electrons can be excited either thermally or by absorption of a photon. It is these impurities that contribute to the infrared response. We characterized the response at chip temperatures of 248 K to 293 K for wavelengths from 1200 nm to 1600 nm and calculated the activation energies at these wavelengths. We found that hot pixels, i.e., pixels with extraordinary high counts in a dark frame, tend to respond stronger to infrared light than normal pixels. This correlation gets stronger for longer wavelengths. It is argued that this response can be used for probing the impurities present in the silicon bulk of the sensors Title: Infrared response of charge-coupled devices Author: Loch, Matthias, Widenhorn, Ralf, Bodegom, Erik Year: 2005 With a band gap of silicon of 1.1eV, the largest wavelength that can excite electrons from the valence to the conduction band is roughly 1100nm. As a consequence, in, for instance, a charge-coupled device, the quantum efficiency (QE) for wavelengths larger than 1100nm is assumed to be zero. We found that there is a response at those longer wavelengths and that the response decreases with increasing wavelength. The QE increases with increasing chip temperature which suggests a thermally activated process. Impurities in the silicon provide the energy levels in the band gap, from which electrons can be excited either thermally or by absorption of a photon. It is these impurities that contribute to the infrared response. We characterized the response at chip temperatures of 248 K to 293 K for wavelengths from 1200 nm to 1600 nm and calculated the activation energies at these wavelengths. We found that hot pixels, i.e., pixels with extraordinary high counts in a dark frame, tend to respond stronger to infrared light than normal pixels. This correlation gets stronger for longer wavelengths. It is argued that this response can be used for probing the impurities present in the silicon bulk of the sensors Close

• 8. [Article] Residual images in charged-coupled device detectors

  We present results of a systematic study of persistent, or residual, images that occur in charged-coupled device (CCD) detectors. A phenomenological model for these residual images, also known as "ghosting," ...

  Citation × Citation Citation Abstract Copy Title: Residual images in charged-coupled device detectors Author: Rest, Armin, Mündermann, Lars, Widenhorn, Ralf, Bodegom, Erik, McGlinn, T. C. Year: 2002 We present results of a systematic study of persistent, or residual, images that occur in charged-coupled device (CCD) detectors. A phenomenological model for these residual images, also known as "ghosting," is introduced. This model relates the excess dark current in a CCD after exposure to the number of filled impurity sites which is tested for various temperatures and exposure times. We experimentally derive values for the cross section, density, and characteristic energy of the impurity sites responsible for the residual images. Title: Residual images in charged-coupled device detectors Author: Rest, Armin, Mündermann, Lars, Widenhorn, Ralf, Bodegom, Erik, McGlinn, T. C. Year: 2002 We present results of a systematic study of persistent, or residual, images that occur in charged-coupled device (CCD) detectors. A phenomenological model for these residual images, also known as "ghosting," is introduced. This model relates the excess dark current in a CCD after exposure to the number of filled impurity sites which is tested for various temperatures and exposure times. We experimentally derive values for the cross section, density, and characteristic energy of the impurity sites responsible for the residual images. Close

• 9. [Article] Study of the numerical modeling of the temperature dependence of the dark current in Charge Coupled Devices

  As it is well known, the classical works of the Dark Current Spectroscopy method allow - using some not too accurate theoretical relations, but huge numbers of dark current values for thousands of pixels ...

  Citation × Citation Citation Abstract Copy Title: Study of the numerical modeling of the temperature dependence of the dark current in Charge Coupled Devices Author: Widenhorn, Ralf, Tunaru, Ionel, Bodegom, Erik, Iordache, Dan A. Year: 2010 As it is well known, the classical works of the Dark Current Spectroscopy method allow - using some not too accurate theoretical relations, but huge numbers of dark current values for thousands of pixels - the evaluation of a reduced number of basic impurities parameters. Unlike these works, this paper tries to obtain--by means of some better approximations of the Shockley-Read-Hall (SRH) model--more information about the studied impurities, as well as the study of the compatibility of the used theoretical model SRH relative to the experimental data. In this manner, both the compatibility SRH model with the studied experimental data was checked up, as well as the values of some additional physical parameters of the impurified semiconductor (the logarithms of the pre-exponential factors lnDiff, lnDep, the effective value of the energy gap Eg) and of the separate capture cross-sections of the free electrons, and holes, respectively, by the studied deep-level contaminants, were evaluated. Title: Study of the numerical modeling of the temperature dependence of the dark current in Charge Coupled Devices Author: Widenhorn, Ralf, Tunaru, Ionel, Bodegom, Erik, Iordache, Dan A. Year: 2010 As it is well known, the classical works of the Dark Current Spectroscopy method allow - using some not too accurate theoretical relations, but huge numbers of dark current values for thousands of pixels - the evaluation of a reduced number of basic impurities parameters. Unlike these works, this paper tries to obtain--by means of some better approximations of the Shockley-Read-Hall (SRH) model--more information about the studied impurities, as well as the study of the compatibility of the used theoretical model SRH relative to the experimental data. In this manner, both the compatibility SRH model with the studied experimental data was checked up, as well as the values of some additional physical parameters of the impurified semiconductor (the logarithms of the pre-exponential factors lnDiff, lnDep, the effective value of the energy gap Eg) and of the separate capture cross-sections of the free electrons, and holes, respectively, by the studied deep-level contaminants, were evaluated. Close

• 10. [Article] Interpreting Activation Energies in Digital Image Sensors

  We present a study demonstrating the dependence of apparent activation energies on signal charge in digital image sensors. The data presented in this paper are for a charge-coupled device imager, but the ...

  Citation × Citation Citation Abstract Copy Title: Interpreting Activation Energies in Digital Image Sensors Author: Dunlap, Justin C., Blouke, Morley M., Bodegom, Erik, Widenhorn, Ralf Year: 2015 We present a study demonstrating the dependence of apparent activation energies on signal charge in digital image sensors. The data presented in this paper are for a charge-coupled device imager, but the analysis can be applied to CMOS sensors or generally to any system that shows nonlinearity with respect to time. Activation energies for some pixels are observed to vary between values at about half the bandgap of silicon, when calculated at low signal-charge levels, to values approaching the bandgap when calculated at high signal-charge levels. As such, the traditional method of calculating activation energies using a single exposure time at varying temperatures will result in different activation energies dependent on the exposure time chosen, making it difficult to draw physically meaningful conclusions from its value. Therefore, a method of calculating activation energies using a single signal-charge level is proposed, making it easier to correlate activation energies with impurities. Further, we demonstrate how a model of a pixel with a fixed location impurity in conjunction with a moving depletion edge, due to a changing depletion region size, can lead to this behavior. Title: Interpreting Activation Energies in Digital Image Sensors Author: Dunlap, Justin C., Blouke, Morley M., Bodegom, Erik, Widenhorn, Ralf Year: 2015 We present a study demonstrating the dependence of apparent activation energies on signal charge in digital image sensors. The data presented in this paper are for a charge-coupled device imager, but the analysis can be applied to CMOS sensors or generally to any system that shows nonlinearity with respect to time. Activation energies for some pixels are observed to vary between values at about half the bandgap of silicon, when calculated at low signal-charge levels, to values approaching the bandgap when calculated at high signal-charge levels. As such, the traditional method of calculating activation energies using a single exposure time at varying temperatures will result in different activation energies dependent on the exposure time chosen, making it difficult to draw physically meaningful conclusions from its value. Therefore, a method of calculating activation energies using a single signal-charge level is proposed, making it easier to correlate activation energies with impurities. Further, we demonstrate how a model of a pixel with a fixed location impurity in conjunction with a moving depletion edge, due to a changing depletion region size, can lead to this behavior. Close