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• 1. [Article] Temperature dependence of dark current in a CCD

  We present data for dark current of a back-illuminated CCD over the temperature range of 222 to 291 K. Using an Arrhenius law, we found that the analysis of the data leads to the relation between the prefactor ...

  Citation × Citation Citation Abstract Copy Title: Temperature dependence of dark current in a CCD Author: Widenhorn, Ralf, Blouke, Morley M., Weber, Alexander, Rest, Armin, Bodegom, Erik Year: 2002 We present data for dark current of a back-illuminated CCD over the temperature range of 222 to 291 K. Using an Arrhenius law, we found that the analysis of the data leads to the relation between the prefactor and the apparent activation energy as described by the Meyer-Neldel rule. However, a more detailed analysis shows that the activation energy for the dark current changes in the temperature range investigated. This transition can be explained by the larger relative importance at high temperatures of the diffusion dark current and at low temperatures by the depletion dark current. The diffusion dark current, characterized by the band gap of silicon, is uniform for all pixels. At low temperatures, the depletion dark current, characterized by half the band gap, prevails, but it varies for different pixels. Dark current spikes are pronounced at low temperatures and can be explained by large concentrations of deep level impurities in those particular pixels. We show that fitting the data with the impurity concentration as the only variable can explain the dark current characteristics of all the pixels on the chip. Title: Temperature dependence of dark current in a CCD Author: Widenhorn, Ralf, Blouke, Morley M., Weber, Alexander, Rest, Armin, Bodegom, Erik Year: 2002 We present data for dark current of a back-illuminated CCD over the temperature range of 222 to 291 K. Using an Arrhenius law, we found that the analysis of the data leads to the relation between the prefactor and the apparent activation energy as described by the Meyer-Neldel rule. However, a more detailed analysis shows that the activation energy for the dark current changes in the temperature range investigated. This transition can be explained by the larger relative importance at high temperatures of the diffusion dark current and at low temperatures by the depletion dark current. The diffusion dark current, characterized by the band gap of silicon, is uniform for all pixels. At low temperatures, the depletion dark current, characterized by half the band gap, prevails, but it varies for different pixels. Dark current spikes are pronounced at low temperatures and can be explained by large concentrations of deep level impurities in those particular pixels. We show that fitting the data with the impurity concentration as the only variable can explain the dark current characteristics of all the pixels on the chip. Close

• 2. [Article] Computation of dark frames in digital imagers

  Dark current is caused by electrons that are thermally exited into the conduction band. These electrons are collected by the well of the CCD and add a false signal to the chip. We will present an algorithm ...

  Citation × Citation Citation Abstract Copy Title: Computation of dark frames in digital imagers Author: Widenhorn, Ralf, Rest, Armin, Blouke, Morley M., Berry, Richard L., Bodegom, Erik Year: 2007 Dark current is caused by electrons that are thermally exited into the conduction band. These electrons are collected by the well of the CCD and add a false signal to the chip. We will present an algorithm that automatically corrects for dark current. It uses a calibration protocol to characterize the image sensor for different temperatures. For a given exposure time, the dark current of every pixel is characteristic of a specific temperature. The dark current of every pixel can therefore be used as an indicator of the temperature. Hot pixels have the highest signal-to-noise ratio and are the best temperature sensors. We use the dark current of a several hundred hot pixels to sense the chip temperature and predict the dark current of all pixels on the chip. Dark current computation is not a new concept, but our approach is unique. Some advantages of our method include applicability for poorly temperature-controlled camera systems and the possibility of ex post facto dark current correction. Title: Computation of dark frames in digital imagers Author: Widenhorn, Ralf, Rest, Armin, Blouke, Morley M., Berry, Richard L., Bodegom, Erik Year: 2007 Dark current is caused by electrons that are thermally exited into the conduction band. These electrons are collected by the well of the CCD and add a false signal to the chip. We will present an algorithm that automatically corrects for dark current. It uses a calibration protocol to characterize the image sensor for different temperatures. For a given exposure time, the dark current of every pixel is characteristic of a specific temperature. The dark current of every pixel can therefore be used as an indicator of the temperature. Hot pixels have the highest signal-to-noise ratio and are the best temperature sensors. We use the dark current of a several hundred hot pixels to sense the chip temperature and predict the dark current of all pixels on the chip. Dark current computation is not a new concept, but our approach is unique. Some advantages of our method include applicability for poorly temperature-controlled camera systems and the possibility of ex post facto dark current correction. Close

• 3. [Article] Interpreting Activation Energies in Digital Image Sensors

  We present a study demonstrating the dependence of apparent activation energies on signal charge in digital image sensors. The data presented in this paper are for a charge-coupled device imager, but the ...

  Citation × Citation Citation Abstract Copy Title: Interpreting Activation Energies in Digital Image Sensors Author: Dunlap, Justin C., Blouke, Morley M., Bodegom, Erik, Widenhorn, Ralf Year: 2015 We present a study demonstrating the dependence of apparent activation energies on signal charge in digital image sensors. The data presented in this paper are for a charge-coupled device imager, but the analysis can be applied to CMOS sensors or generally to any system that shows nonlinearity with respect to time. Activation energies for some pixels are observed to vary between values at about half the bandgap of silicon, when calculated at low signal-charge levels, to values approaching the bandgap when calculated at high signal-charge levels. As such, the traditional method of calculating activation energies using a single exposure time at varying temperatures will result in different activation energies dependent on the exposure time chosen, making it difficult to draw physically meaningful conclusions from its value. Therefore, a method of calculating activation energies using a single signal-charge level is proposed, making it easier to correlate activation energies with impurities. Further, we demonstrate how a model of a pixel with a fixed location impurity in conjunction with a moving depletion edge, due to a changing depletion region size, can lead to this behavior. Title: Interpreting Activation Energies in Digital Image Sensors Author: Dunlap, Justin C., Blouke, Morley M., Bodegom, Erik, Widenhorn, Ralf Year: 2015 We present a study demonstrating the dependence of apparent activation energies on signal charge in digital image sensors. The data presented in this paper are for a charge-coupled device imager, but the analysis can be applied to CMOS sensors or generally to any system that shows nonlinearity with respect to time. Activation energies for some pixels are observed to vary between values at about half the bandgap of silicon, when calculated at low signal-charge levels, to values approaching the bandgap when calculated at high signal-charge levels. As such, the traditional method of calculating activation energies using a single exposure time at varying temperatures will result in different activation energies dependent on the exposure time chosen, making it difficult to draw physically meaningful conclusions from its value. Therefore, a method of calculating activation energies using a single signal-charge level is proposed, making it easier to correlate activation energies with impurities. Further, we demonstrate how a model of a pixel with a fixed location impurity in conjunction with a moving depletion edge, due to a changing depletion region size, can lead to this behavior. Close