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Temperature
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Gallium compounds
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Indium gallium zinc oxide
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Stability
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TFT
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TFT structure
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ScholarsArchive
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1. [Article] Fabrication process assessment and negative bias illumination stress study of IGZO and ZTO TFTs
Indium-gallium-zinc oxide (IGZO) and zinc-tin oxide (ZTO) are investigated for thin-film transistor (TFT) applications. Negative bias illumination stress (NBIS) is employed for electrical stability assessment. ...Citation